典型文献
Lensless imaging through thin scattering layers under broadband illumination
文献摘要：
Lensless scattering imaging is a prospective approach to microscopy in which a high-resolution image of an object is reconstructed from one or more measured speckle patterns,thus providing a solution in situations where the use of imaging optics is not possible.However,current lensless scattering imaging methods are typically limited by the need for a light source with a narrowband spectrum.Here,we propose two general approaches that enable single-shot lensless scattering imaging under broadband illumination in both noninvasive[without point spread function(PSF)calibration]and invasive(with PSF calibration)modes.The first noninvasive approach is based on a numerical refinement of the broadband pattern in the cepstrum incorporated with a modified phase retrieval strategy.The latter invasive approach is correlation inspired and generalized within a computational optimization framework.Both approaches are experimentally verified using visible radiation with a full-width-at-half-maxi-mum bandwidth as wide as 280 nm(△λ/λ=44.8％)and a speckle contrast ratio as low as 0.0823.Because of its generality and ease of implementation,we expect this method to find widespread applications in ultrafast science,passive sensing,and biomedical applications.
文献关键词：
中图分类号：
作者姓名：
WEI Li;BINGJIAN WANG;TENGFEI WU;FEIHU XU;XIAOPENG SHAO
作者机构：
School of Optoelectronic Engineering,Xidian University,Xi'an 710071,China;School of Physics,Xidian University,Xi'an 710071,China;Laboratoire Kastler Brossel,ENS-Université PSL,CNRS,Sorbonne Université,College de France,F-75005 Paris,France;Hefei National Laboratory for Physical Sciences at Microscale and School of Physical Science,University of Science and Technology of China,Hefei 230026,China
文献出处：
引用格式：
[1]WEI Li;BINGJIAN WANG;TENGFEI WU;FEIHU XU;XIAOPENG SHAO-.Lensless imaging through thin scattering layers under broadband illumination)[J].光子学研究（英文）,2022(11):2471-2487
A类：
Lensless
B类：
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AB值：
0.620249
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